Absolute head media spacing measurement in-situ

Author

Yuan, Zhi-Min ; Liu, Bo

Author_Institution

Data Storage Inst., Singapore, Singapore

fYear

2005

fDate

4-8 April 2005

Firstpage

1397

Lastpage

1398

Abstract

As the flying height (FH) goes to sub-10 nm, the actual FH and the flying stability of slider become even important to maintain the reliability of head-disk interface. Currently, the FH testing uses white light interferometry method. Due to ESD and the cost etc. issues, the FH of slider is only sample tested at a small percentage. The read/write based in-situ FH testing methods do not have these concerns. But the absolute FH cannot be got unless doing the touch down test. However, the head cannot afford the touch down for current GMR head. This work proposes a new method to test absolute head media spacing in-situ without physically changing the FH.

Keywords

giant magnetoresistance; hard discs; light interferometry; magnetic heads; magnetoresistive devices; materials testing; stability; 10 nm; absolute head media spacing measurement; flying height testing; flying stability; giant magnetoresistance head; head-disk interface; light interferometry method; magnetic read/write head; recording slider; Data engineering; Frequency; Magnetic heads; Maintenance engineering; Memory; Optical interferometry; Optical recording; Reliability engineering; Stability; Testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Magnetics Conference, 2005. INTERMAG Asia 2005. Digests of the IEEE International

Print_ISBN

0-7803-9009-1

Type

conf

DOI

10.1109/INTMAG.2005.1464128

Filename

1464128