DocumentCode :
3537527
Title :
Development of polyethylene insulation diagnosis of high voltage cables in France
Author :
Clavreul, R. ; Duchateau, F.
Author_Institution :
Electricite de France, Moret-sur-Loing, France
fYear :
1995
fDate :
17-20 Sep 1995
Firstpage :
27
Lastpage :
30
Abstract :
The objective of the development of polyethylene insulation diagnosis of high voltage cables in France was first to check or to determine the origin of the damage after a dielectric breakdown and to confirm hypothesis such as an accidental water penetration in the insulation or an excess temperature rise in the cable. According to our experience gained in the operation, the main cause of the dielectric breakdown of extruded cables is water penetration in the insulation, generally in high voltage extruded cables manufactured without any waterproof screen in the sixties. Other defects correlated with an excess of the temperature rise in on-line cables can also be observed : we can note the existence of a high temperature annealing in polyethylene, or eventually a modification of the mechanical properties of the insulation. Sometimes manufactured defects, for example large cavities in the insulation, can also be detected. Finally, an evolution of the insulation could be correlated with the polyethylene ageing
Keywords :
ageing; annealing; electric breakdown; insulation testing; moisture; polyethylene insulation; power cable insulation; power cable testing; France; HV cables; dielectric breakdown; excess temperature rise; extruded cables; high temperature annealing; high voltage cables; insulation cavities; mechanical properties; polyethylene ageing; polyethylene insulation diagnosis; water penetration; Annealing; Breakdown voltage; Cable insulation; Dielectric breakdown; Dielectrics and electrical insulation; Manufacturing; Mechanical cables; Mechanical factors; Polyethylene; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulating Materials, 1995. International Symposium on
Conference_Location :
Tokyo
Print_ISBN :
4-88686-047-8
Type :
conf
DOI :
10.1109/ISEIM.1995.496501
Filename :
496501
Link To Document :
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