Title :
Fractal analysis of 3D simulated tree patterns considering critical field and potential drop
Author :
Kobayashi, Shozo ; Arai, Toshifumi ; Kudo, Katsutoshi
Author_Institution :
Meiji Univ., Kawasaki, Japan
Abstract :
In this paper, we simulated 3D tree patterns with the field controlled random nature and used the parameters Vapp (applied voltage), Vd (potential drop in a tree channel), Ec (critical field for tree propagation) and η (the relation between local field and growing probability). As a result, the various shapes of tree patterns are obtained and the model holds more physical realizations
Keywords :
fractals; trees (electrical); 3D tree patterns; critical field; fractal analysis; potential drop; simulation; Analytical models; Boundary conditions; Computational modeling; Electrodes; Fractals; Laplace equations; Lattices; Needles; Pattern analysis; Surface discharges;
Conference_Titel :
Electrical Insulating Materials, 1995. International Symposium on
Conference_Location :
Tokyo
Print_ISBN :
4-88686-047-8
DOI :
10.1109/ISEIM.1995.496506
