• DocumentCode
    3537578
  • Title

    Fractal analysis of 3D simulated tree patterns considering critical field and potential drop

  • Author

    Kobayashi, Shozo ; Arai, Toshifumi ; Kudo, Katsutoshi

  • Author_Institution
    Meiji Univ., Kawasaki, Japan
  • fYear
    1995
  • fDate
    17-20 Sep 1995
  • Firstpage
    51
  • Lastpage
    54
  • Abstract
    In this paper, we simulated 3D tree patterns with the field controlled random nature and used the parameters Vapp (applied voltage), Vd (potential drop in a tree channel), Ec (critical field for tree propagation) and η (the relation between local field and growing probability). As a result, the various shapes of tree patterns are obtained and the model holds more physical realizations
  • Keywords
    fractals; trees (electrical); 3D tree patterns; critical field; fractal analysis; potential drop; simulation; Analytical models; Boundary conditions; Computational modeling; Electrodes; Fractals; Laplace equations; Lattices; Needles; Pattern analysis; Surface discharges;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulating Materials, 1995. International Symposium on
  • Conference_Location
    Tokyo
  • Print_ISBN
    4-88686-047-8
  • Type

    conf

  • DOI
    10.1109/ISEIM.1995.496506
  • Filename
    496506
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3537578