Title :
Session I GaN modeling and failure analysis
Abstract :
Start of the above-titled section of the conference proceedings record.
Keywords :
Electron Devices Society; Failure analysis; Gallium arsenide; Gallium nitride; Reliability engineering;
Conference_Titel :
ROCS Workshop, 2008 [Reliability of Compound Semiconductors Workshop]
Conference_Location :
Monterey, CA, USA
Print_ISBN :
0-7908-0120-5
DOI :
10.1109/ROCS.2008.4686649
