Title :
Tilted magnetization in Cr/CoCrPt thin film recording media
Author :
Ajan, Anlony ; Inomata, A. ; Yamagishi, W.
Author_Institution :
Fujitsu Labs. Ltd., Atsugi, Japan
Abstract :
The epitaxial growth of Cr/CoCrPt thin film recording media using sputter deposition was studied in this paper. Its structural properties were investigated by X-ray diffraction (XRD) and high-resolution transmission electron microscopy (HRTEM) to analyze the crystallographic texture and granularity of the films, respectively. SQUID and Kerr magnetometers were used to measure the magnetisation of the film. Also, read/write properties of the film were also studied.
Keywords :
X-ray diffraction; chromium; chromium alloys; cobalt alloys; magnetic epitaxial layers; magnetic recording; magnetisation; platinum alloys; sputter deposition; transmission electron microscopy; Cr-CoCrPt; HRTEM; Kerr magnetometer; SQUID magnetometer; X-ray diffraction; XRD; crystallographic texture; epitaxial growth; granularity; high-resolution transmission electron microscopy; read/write properties; sputter deposition; structural properties; thin film recording media; tilted magnetization; Chromium; Crystallography; Epitaxial growth; Magnetic analysis; Magnetization; Sputtering; Transistors; Transmission electron microscopy; X-ray diffraction; X-ray scattering;
Conference_Titel :
Magnetics Conference, 2005. INTERMAG Asia 2005. Digests of the IEEE International
Print_ISBN :
0-7803-9009-1
DOI :
10.1109/INTMAG.2005.1464230
