Title :
Application of Rigorous Diffraction Theory to Scanning Optical Microscope Problems
Author :
Morgan, S.P. ; Somekh, M.G. ; See, C.W.
Author_Institution :
University of Nottingham
Keywords :
Optical diffraction; Optical microscopy;
Conference_Titel :
Lasers and Electro-Optics Europe, 1998. 1998 CLEO/Europe. Conference on
Conference_Location :
Glasgow, Scotland
Print_ISBN :
0-7803-4233X
DOI :
10.1109/CLEOE.1998.719254
