Title :
XMCD studies of [001] oriented NiFe/Mn1-xPtx exchange coupled bilayers
Author :
Yamato, T. ; Kume, T. ; Kato, T. ; Nakamura, T. ; Fujiwara, Y. ; Iwata, S. ; Tsunashima, S.
Author_Institution :
Dept. of Electron., Nagoya Univ., Japan
Abstract :
The magnetic behavior of Mn and Fe at the interface of NiFe/Mn1-xPtx is investigated by X-ray magnetic circular dichroism (XMCD) measurements. The bilayer films are epitaxially grown at Pt/Cr/MgO(001) substrates by MBE at room temperature. The structure and magnetic properties of the films are studied using in-situ RHEED and ex-situ XRD, and by AGM and torque magnetometer, respectively. Hysteresis loops is observed not only on Fe but also on Mn, indicating the appearance of uncompensated Mn moment near the interface between NiFe and MnPt layers. Also, it is found that the Mn XMCD signal increases as x increases.
Keywords :
X-ray diffraction; antiferromagnetic materials; ferromagnetic materials; interface magnetism; iron alloys; magnetic circular dichroism; magnetic epitaxial layers; magnetic hysteresis; magnetic moments; manganese alloys; molecular beam epitaxial growth; nickel alloys; platinum alloys; reflection high energy electron diffraction; 293 to 298 K; MBE; Mn moment; NiFe-Mn1-xPtx; Pt-Cr-MnO; RHEED; X-ray magnetic circular dichroism spectra; XRD; [001] oriented bilayers; epitaxial growth; exchange coupled bilayers; ferromagnetic/antiferromagnetic interface; hysteresis loops; interface magnetism; magnetic properties; molecular beam epitaxy; room temperature; structural properties; surface sensitive total electron yield method; torque magnetometer;
Conference_Titel :
Magnetics Conference, 2005. INTERMAG Asia 2005. Digests of the IEEE International
Print_ISBN :
0-7803-9009-1
DOI :
10.1109/INTMAG.2005.1464251
