DocumentCode :
3538517
Title :
Evolution of magnetic microstructure with coercivity in SmCo 2:17 magnets for high temperature application
Author :
Gutfleisch, O. ; Khlopkov, K. ; Yan, A. ; Schäfer, R. ; Müller, K.H. ; Schultz, L.
Author_Institution :
Inst. for Metallic Mater., IFW, Dresden, Germany
fYear :
2005
fDate :
4-8 April 2005
Firstpage :
1641
Lastpage :
1642
Abstract :
The evolution of the magnetic microstructure of a high-temperature-grades of sintered SmCo 2:17-type magnets is correlated with the development of coercivity and microchemical changes occurring during the slow cooling ramp from the aging temperature of 850°C. The magnets are annealed at 850°C and then slow cooled to 400°C, 600°C, 700°C, and 850°C and quenched, respectively. The evolution of the coercivity during the slow cooling of the magnet and the magnetic domain structure of the thermally demagnetised magnets are investigated by magnetic force microscopy and Kerr microscopy. TEM reveals a cell size of about 100 nm within grains of several tenths of microns.
Keywords :
ageing; annealing; cobalt alloys; coercive force; copper alloys; demagnetisation; grain size; iron alloys; magnetic domains; magnetic force microscopy; optical Kerr effect; permanent magnets; quenching (thermal); samarium alloys; transmission electron microscopy; zirconium alloys; 400 degC; 600 degC; 700 degC; 850 degC; Kerr microscopy; Sm(Co0.738Fe0.1Cu0.088Zr0.028)7.1 9; TEM; aging; annealing; cell size; coercivity; demagnetisation; grains; high-temperature sintered magnets; magnetic domain structure; magnetic force microscopy; magnetic microstructure; microchemical changes; quenching; slow cooling; Aging; Annealing; Coercive force; Cooling; Magnetic domains; Magnetic force microscopy; Magnets; Micromagnetics; Temperature; Transmission electron microscopy;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Magnetics Conference, 2005. INTERMAG Asia 2005. Digests of the IEEE International
Print_ISBN :
0-7803-9009-1
Type :
conf
DOI :
10.1109/INTMAG.2005.1464254
Filename :
1464254
Link To Document :
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