Title :
Quantized state feedback control for multiple-input systems subject to signal-to-noise ratio constraints
Author :
Yu Feng ; Xiang Chen ; Guoxiang Gu
Author_Institution :
Dept. of Inf. Eng., Zhejiang Univ. of Technol., Hangzhou, China
Abstract :
This paper deals with the problem of state feedback stabilization for multiple-input discrete-time systems over communication channels, where both logarithmic quantization errors and white noises are included. The logarithmic quantizer is characterized by a received signal-to-error ratio (R-SER) model; while the white noises are modelled by additive white Gaussian noise (AWGN) channels where signal-to-noise ratio constraints are imposed. The underlying channel capacity is defined through a mixed deterministic stochastic way. The desired control law is assumed to stabilize the system with the presence of quantized errors and to satisfy some predetermined power level, simultaneously. By assuming that the overall channel capacity can be allocated among the communication channels, a solvability condition is derived in terms of Mahler measure of the plant and the desired feedback gain is given by solving some algebraic Riccati equations. An example is included to illustrate the current results.
Keywords :
AWGN channels; Riccati equations; discrete time systems; networked control systems; stability; state feedback; AWGN channels; Mahler measure; R-SER model; additive white Gaussian noise channels; algebraic Riccati equations; communication channels; control law; feedback gain; logarithmic quantization errors; mixed deterministic stochastic method; multiple-input discrete-time systems; overall channel capacity allocation; power level; quantized errors; quantized state feedback control; received signal-to-error ratio model; signal-to-noise ratio constraints; solvability condition; state feedback stabilization problem; AWGN channels; Channel capacity; Quantization (signal); Signal to noise ratio; State feedback; White noise;
Conference_Titel :
Decision and Control (CDC), 2013 IEEE 52nd Annual Conference on
Conference_Location :
Firenze
Print_ISBN :
978-1-4673-5714-2
DOI :
10.1109/CDC.2013.6761036