Title :
Research on electromagnetic environment effects for typical shortwave communication equipment
Author :
Xiaodong, Pan ; Guanghui, Wei ; Lifei, Geng ; Genchun, Zhu
Author_Institution :
Res. Inst. of Electrostatic & Electromagn. Protection, Mech. Eng. Coll., Shijiazhuang, China
Abstract :
The UWB and CW irradiation effects on typical communication equipment were researched in this paper. The UWB experiments indicate that when the irradiation E-field intensity is larger than 50 kV/m, the display panel fault of shortwave communication station appears. The coupling channel is the display panel of the station. When the irradiation E-field intensity is larger than 150 kV/m, the effect of display panel fault, break down, restart and voice stoppage appears. The main coupling channel is the power supply cord of communication station. The continuous wave experiments indicate that when the interference frequency is close to the station working frequency, it has the best interference effect. When the frequency variation Δf is smaller than 15 kHz, the interference effect could be preferable, and the communication station interference is sensitive to E-field intensity. The research conclusions above provide technology reference to further study electromagnetic environment effects for shortwave communication equipment.
Keywords :
radiofrequency interference; ultra wideband communication; wireless channels; CW irradiation effects; UWB irradiation effects; coupling channel; display panel fault; electromagnetic environment effects; interference frequency; irradiation E-field intensity; power supply cord; shortwave communication equipment; shortwave communication station interference; station working frequency; voice stoppage; Cable shielding; Communication cables; Monitoring; Optical coupling; Optical pulses; Optical sensors; Ultra wideband antennas; UWB; continuous wave; cumulative effects; irradiation effects; shortwave communication equipment;
Conference_Titel :
Cross Strait Quad-Regional Radio Science and Wireless Technology Conference (CSQRWC), 2011
Conference_Location :
Harbin
Print_ISBN :
978-1-4244-9792-8
DOI :
10.1109/CSQRWC.2011.6036944