Title :
A study of noise effects due to the diode protection for shield resistance measurement of GMR recording heads
Author :
Siritaratiwat, A. ; Tongsomporn, D. ; Chooruang, K. ; Afzulpurka, N.
Author_Institution :
Dept. of Electr. Eng., Khon Kaen Univ., Thailand
Abstract :
This paper examines the noise effect of protection diodes used for protecting voltage breakdown during MR-shield resistance measurement in quasi-static test (QST) for giant magnetoresistive heads (GMR). Two fasions of diode protection are presented and the noise behavior of them are discussed and compared in terms of GMR noise test.
Keywords :
electric resistance measurement; giant magnetoresistance; magnetic heads; magnetic recording noise; GMR noise test; GMR recording heads; MR-shield resistance measurement; diode protection; giant magnetoresistive heads; noise effects; protection diodes; quasistatic test; shield resistance measurement; voltage breakdown; Electric breakdown; Electrical resistance measurement; Giant magnetoresistance; Magnetic heads; Magnetic noise; Noise level; Probes; Protection; Schottky diodes; Testing;
Conference_Titel :
Magnetics Conference, 2005. INTERMAG Asia 2005. Digests of the IEEE International
Print_ISBN :
0-7803-9009-1
DOI :
10.1109/INTMAG.2005.1464291
