Title :
Poisoning of orientation ratio on NiP-coated substrates
Author :
Karis, T.E. ; Guo, X.C. ; Marinero, E. ; Yen, B.K. ; Marchon, B.
Author_Institution :
Hitachi GST, San Jose, CA, USA
Abstract :
The surface chemical evolution of NiP-coated AlMag disk substrate was analyzed using contact angle, X-ray photoelectron spectroscopy (XPS) and Fourier transform infrared spectroscopy techniques. Its effect on magnetic film structure and orientation ratio was also studied. It was also shown that slow nickel carbonate surface growth under ambient condition poisoned the orientation ratio of the structure.
Keywords :
Fourier transform spectra; X-ray photoelectron spectra; contact angle; infrared spectra; magnetic anisotropy; magnetic thin films; nickel compounds; surface chemistry; surface energy; Fourier transform infrared spectroscopy; NiCO3; NiP; X-ray photoelectron spectroscopy; coated substrates; contact angle; disk substrate; magnetic film structure; orientation ratio poisoning; surface chemical evolution; surface growth; Anisotropic magnetoresistance; Computational Intelligence Society; Energy measurement; Magnetic anisotropy; Magnetic films; Perpendicular magnetic anisotropy; Pollution measurement; Substrates; Surface topography; Time measurement;
Conference_Titel :
Magnetics Conference, 2005. INTERMAG Asia 2005. Digests of the IEEE International
Print_ISBN :
0-7803-9009-1
DOI :
10.1109/INTMAG.2005.1464303
