Implementation of testable reversible sequential circuit on FPGA

The design of testable sequential circuits by two vectors using conservative logic. The proposed sequential circuits based on conservative logic outclass the traditional sequential circuits built using classical gates in terms of testability. Any sequential circuits based on conservative logic can test for stuck-at 0 and stuck-at 1 fault by using two vectors 0 and 1. The design of testable Master-slave D flip-flop, Double Edge triggered flip flop (DET) flip-flop using two vectors 0 and 1 are presented. The importance of the proposed work is that we are designing reversible sequential circuits suitable for testing. Hence both conservative logic and reversible logic is used. In the proposed work, we design a reversible sequential circuit using Fredkin gate. Fredkin gate is the only reversible gate which supports both conservative and reversible logic and also having less quantum delay.