• DocumentCode
    3539788
  • Title

    Microwave properties and anisotropy field distribution in nanogranular Fe-Co-Al-O films

  • Author

    Pasquale, M. ; Coisson, M. ; Perero, S. ; Lim, S.H.

  • Author_Institution
    Dept. of Mater., IEN Galileo Ferraris, Torino, Italy
  • fYear
    2005
  • fDate
    4-8 April 2005
  • Firstpage
    1925
  • Lastpage
    1926
  • Abstract
    In order to investigate and possibly exploit in real devices the interplay between anisotropy terms of different origin, the microwave scattering matrix S of nanogranular Co-Fe-Al-O films with an induced in-plane anisotropy under the additional influence of an external field Hext, is measured. The induced anisotropy causes a well defined domain pattern, encompassing a few nanograins, as shown by AFM/MFM imaging. The low anisotropy field measured is due to the suppression of the magnetocrystalline anisotropy of individual grains. Microwave scattering results show that at zero applied field the resonance peaks occur at 4-10 GHz, much higher than the ferromagnetic resonance frequency ffmr≈ 1-2 GHz estimated from vibrating sample magnetometer (VSM) measurements for the 550 nm and 125 nm thick films, respectively. The effect is mainly connected to the incomplete suppression of the magnetocrystalline anisotropy at low applied field.
  • Keywords
    aluminium compounds; atomic force microscopy; cobalt compounds; ferromagnetic materials; ferromagnetic resonance; granular materials; induced anisotropy (magnetic); iron compounds; magnetic domains; magnetic force microscopy; magnetic thin films; nanostructured materials; 125 nm; 4 to 10 GHz; 550 nm; AFM; FeCoAlO; MFM; anisotropy field distribution; domain pattern; ferromagnetic resonance frequency; induced in-plane anisotropy; magnetocrystalline anisotropy suppression; microwave scattering matrix; nanogranular films; sample magnetometer; Anisotropic magnetoresistance; Frequency estimation; Magnetic anisotropy; Magnetic field measurement; Magnetic resonance; Microwave devices; Microwave measurements; Nanoscale devices; Perpendicular magnetic anisotropy; Scattering;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Magnetics Conference, 2005. INTERMAG Asia 2005. Digests of the IEEE International
  • Print_ISBN
    0-7803-9009-1
  • Type

    conf

  • DOI
    10.1109/INTMAG.2005.1464397
  • Filename
    1464397