Title :
Sensitivity approach for eigenmode characterization of structures with open boundary conditions
Author :
Bandlow, B. ; Schuhmann, R.
Author_Institution :
Fachgebiet Theor. Elektrotechnik, Tech. Univ. Berlin, Berlin, Germany
Abstract :
The computational models of open resonant nanophotonic structures include perfectly matched layers in order to realize a proper transition to free-space for the electromagnetic waves. As a consequence, the eigenvalue spectrum is spoilt by unwanted eigenmodes which are trapped within these layers. In the context of the finite integration technique we apply a computational inexpensive sensitivity analysis in order to identify those undesired eigenmodes.
Keywords :
eigenvalues and eigenfunctions; electromagnetic waves; integration; nanophotonics; resonance; sensitivity analysis; computational models; eigenmode characterization; eigenvalue spectrum; electromagnetic waves; finite integration technique; open boundary conditions; open resonant nanophotonic structures; sensitivity analysis; Computational modeling; Dielectrics; Eigenvalues and eigenfunctions; Materials; Perfectly matched layers; Sensitivity analysis;
Conference_Titel :
Electromagnetics in Advanced Applications (ICEAA), 2013 International Conference on
Conference_Location :
Torino
Print_ISBN :
978-1-4673-5705-0
DOI :
10.1109/ICEAA.2013.6632358