• DocumentCode
    3539936
  • Title

    Stochastic Petri nets simplification with singular perturbations

  • Author

    Amodéo, L. ; Zerhouni, S. ; El Moudni, A. ; Ferney, M.

  • Author_Institution
    Lab. de Mecanique et Productique, Ecole Nat. d´´Ingenieurs de Belfort, France
  • Volume
    3
  • fYear
    1995
  • fDate
    10-13 Oct 1995
  • Firstpage
    407
  • Abstract
    In this paper, we introduce a new simplification of stochastic Petri net models. This simplification uses the singular perturbation method for discrete event systems in continuous time. We adapt this method for stochastic Petri net models. The model studied should have the double time scale property in order to apply this method of simplification. The decoupling method gives us two sub-systems, a fast and a slow evolution. These evolutions are the probabilities to be in a certain marking of the stochastic Petri net. For these two sub-systems, we only preserve the slow evolution of the marking probabilities, which yields the most precision given by the singular perturbation in continuous time. The main advantage of this method is to reduce the number of places and/or transitions of the stochastic Petri net. The calculation of the performance rates is then simplified. For complex stochastic Petri net models, this method allows one to draw the sub-system with a slow evolution
  • Keywords
    Markov processes; Petri nets; continuous time systems; perturbation techniques; probability; production control; reduced order systems; Markov chains; continuous time systems; decoupling method; discrete event systems; dynamic systems; model reduction; probability; production control; singular perturbations; stochastic Petri net models; Analytical models; Discrete event simulation; Discrete event systems; Equations; Perturbation methods; Petri nets; Reduced order systems; Resource management; Stochastic processes; Stochastic systems;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Emerging Technologies and Factory Automation, 1995. ETFA '95, Proceedings., 1995 INRIA/IEEE Symposium on
  • Conference_Location
    Paris
  • Print_ISBN
    0-7803-2535-4
  • Type

    conf

  • DOI
    10.1109/ETFA.1995.496741
  • Filename
    496741