DocumentCode
3539996
Title
High density magnetic random access memory using a pair of asymmetrical cell
Author
Lim, C.K. ; Kim, Y.S. ; Park, N.Y. ; Lee, J.
Author_Institution
Samsung Adv. Inst. of Technol., Suwon, South Korea
fYear
2005
fDate
4-8 April 2005
Firstpage
1975
Lastpage
1976
Abstract
Magnetic random access memory (MRAM) is one of the most promising candidates to provide energy efficient and non-volatile memory. We present a new MRAM design using a pair of asymmetrical cells. The pair cells have parallelogram shaped to induce broken shape magnetic anisotropy along the short axis of the cell. One important advantage of the pair cells is that they can share the same Word and Bit lines intersection in the MRAM architecture. This means that the number of electrical current lines can be reduced and leading to higher recording density. The new concept is successfully demonstrated using finite element micromagnetic simulation.
Keywords
finite element analysis; magnetic anisotropy; magnetic recording; magnetic storage; micromagnetics; random-access storage; MRAM; asymmetrical cell; finite element micromagnetic simulation; high density magnetic random access memory; magnetic anisotropy; nonvolatile memory; recording density; Anisotropic magnetoresistance; Finite element methods; Magnetic anisotropy; Magnetic fields; Magnetic separation; Magnetostatics; Perpendicular magnetic anisotropy; Random access memory; Saturation magnetization; Switches;
fLanguage
English
Publisher
ieee
Conference_Titel
Magnetics Conference, 2005. INTERMAG Asia 2005. Digests of the IEEE International
Print_ISBN
0-7803-9009-1
Type
conf
DOI
10.1109/INTMAG.2005.1464426
Filename
1464426
Link To Document