DocumentCode
3540010
Title
A diagnostic reconfiguration methodology for integrated systems
Author
Sharif, Erfaan ; Richardson, Andrew ; Dorey, Tony
Author_Institution
Dept. of Eng., Lancaster Univ., UK
fYear
1997
fDate
35726
Firstpage
42430
Lastpage
42435
Abstract
An Integrated Diagnostic Reconfiguration (IDR) methodology is described using a design example of a smart sensor to illustrate and clarify the techniques involved. Using circuit reconfiguration techniques, IDR can provide improved fault tolerance and self validation of mixed signal integrated systems
Keywords
mixed analogue-digital integrated circuits; ASIC; circuit reconfiguration techniques; diagnostic reconfiguration methodology; fault tolerance; mixed signal integrated systems; self validation; smart sensors;
fLanguage
English
Publisher
iet
Conference_Titel
Testing Mixed Signal Circuits and Systems (Ref. No: 1997/361), IEE Colloquium on
Conference_Location
London
Type
conf
DOI
10.1049/ic:19971194
Filename
663238
Link To Document