DocumentCode :
3540021
Title :
Tunnel magnetoresistance in fully epitaxial MgO double barrier magnetic tunnel junctions
Author :
Nozaki, T. ; Hirohata, A. ; Tezuka, N. ; Sugimoto, S. ; Inomata, K.
Author_Institution :
Graduate Sch. of Eng., Tohoku Univ., Sendai, Japan
fYear :
2005
fDate :
4-8 April 2005
Firstpage :
1981
Lastpage :
1982
Abstract :
The TMR properties of epitaxial Fe(100)/MgO(100)/Fe(100)/MgO(100)/Fe(100) double barrier magnetic tunnel junctions (DMTJs) is reported. Both TMR and I-V characteristics were measured at room temperature using a dc four probe method. Single barrier MTJs (SMTJs) were used as references. A pseudo-spin-valve type TMR curve originated from the different magnetic switching fields (Hsw) for the both top and bottom Fe layers (Hsw = 48 Oe) and for the middle Fe layer (Hsw = 14 Oe). Higher TMR ratios of up to 110% (average: 89%) compared with the SMTJ (average: 77%) are observed for the DMTJ although the magnitude of the TMR ratio for the DMTJ has been reported to be smaller than that for the SMTJs.
Keywords :
iron; magnesium compounds; magnetic epitaxial layers; magnetic switching; spin valves; tunnelling magnetoresistance; Fe-MgO-Fe-MgO-Fe; I-V characteristics; TMR; dc four probe method; fully epitaxial double barrier magnetic tunnel junctions; magnetic switching fields; pseudospin-valve type TMR curve; single barrier MTJ; tunnel magnetoresistance; Amorphous magnetic materials; Amorphous materials; Iron; Magnetic field measurement; Magnetic tunneling; Materials science and technology; Molecular beam epitaxial growth; Random access memory; Temperature; Tunneling magnetoresistance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Magnetics Conference, 2005. INTERMAG Asia 2005. Digests of the IEEE International
Print_ISBN :
0-7803-9009-1
Type :
conf
DOI :
10.1109/INTMAG.2005.1464429
Filename :
1464429
Link To Document :
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