DocumentCode :
3540089
Title :
Signal-power integrity and EMI analysis for singlechip and multi-chip-module applications
Author :
Wane, S. ; Erdem, A Tanju ; le Grontec, A. ; Tesson, O. ; Bardy, Serge ; Kloczkowski, Robert ; Abessolo, Dolphin ; Mattheijssen, Paul
Author_Institution :
NXP Semicond. Caen, Caen, France
fYear :
2013
fDate :
9-13 Sept. 2013
Firstpage :
992
Lastpage :
995
Abstract :
In this paper, a global Chip-Package-PCB Co-Design and Co-Verification methodology is successfully applied to Single-Chip Down-converter circuit and Multi-Chip-Module in transmit mode. Full-wave electromagnetic and thermal Co-Analysis approach is adopted to investigate impact of critical RF couplings, power dissipation and grounding strategies on systemlevel performances. The Single-Chip down-converter circuit shows 43dB conversion gain, with 6.5dB noise figure and output IP3 of 18dBm. The MCM design demonstrates 35dBm output IP3, 25dBm output CP1, with 45dB image rejection with 25dB voltage gain for a dissipated power of 2.2W.
Keywords :
chip scale packaging; chip-on-board packaging; convertors; electromagnetic interference; multichip modules; printed circuits; EMI analysis; co-verification methodology; critical RF couplings; full-wave electromagnetic method; gain 43 dB; global chip-package-PCB co-design; grounding strategies; multichip-module; noise figure 6.5 dB; power 2.2 W; power dissipation; signal-power integrity; single-chip down-converter circuit; system-level performances; thermal co-analysis; transmit mode; Electromagnetic interference; Electrostatic discharges; Grounding; Radio frequency; Satellite broadcasting; Satellites; Solid modeling; Chip-Package-PCB Co-Design; EM couplings; MCM; Power-Signal Integrity; Thermal Analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetics in Advanced Applications (ICEAA), 2013 International Conference on
Conference_Location :
Torino
Print_ISBN :
978-1-4673-5705-0
Type :
conf
DOI :
10.1109/ICEAA.2013.6632389
Filename :
6632389
Link To Document :
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