Title :
Inverse magnetoresistance in magnetic tunnel junction with an Fe3O4 electrode
Author :
Park, Chando ; Zhu, Jian-Gang ; Peng, Y. ; Laughlin, D.E. ; White, R.M.
Author_Institution :
Dept. of Mater. Sci. & Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
Abstract :
This study shows inverse MR in a NiFe/AlOx/ Fe3O4 tunnel junction if sufficiently pure Fe3O4 at the interface with the tunnel barrier can be achieved. Magnetic tunnel junction with the structure of Ta 3 nm/Cu 50 nm/Ta 3 nm/NiFe 10 nm/AlOx 2 nm/Fe (1.8 ∼ 10 nm)-oxidation/Fe 5 nm/Ta 3 nm is deposited on oxidized silicon substrates by using an RF/DC sputtering system. Oxidation of the Fe layer is found to result to an inverse MR. As the unoxidized Fe layer decreases, MR also decreases until it reaches zero, that is, the unoxidized residual Fe phase coexist with the Fe3O4 phase. As the thickness decrease further to 1.8 nm, the MR curve becomes negative (inverse MR).
Keywords :
aluminium compounds; copper; iron; iron alloys; iron compounds; nickel alloys; oxidation; sputter deposition; tantalum; tunnelling magnetoresistance; 1.8 nm; 10 nm; 2 nm; 3 nm; 5 nm; 50 nm; Fe3O4; RF-DC sputtering system; Ta-Cu-Ta-NiFe-AlOx-Fe-O-Fe-Ta; inverse magnetoresistance; magnetic tunnel junction; oxidation; silicon substrates; tunnel barrier; Electrodes; Electrons; Iron; Magnetic materials; Magnetic tunneling; Optical polarization; Oxidation; Plasma measurements; Thickness measurement; Tunneling magnetoresistance;
Conference_Titel :
Magnetics Conference, 2005. INTERMAG Asia 2005. Digests of the IEEE International
Print_ISBN :
0-7803-9009-1
DOI :
10.1109/INTMAG.2005.1464442