Title :
Electromagnetic modeling and experimental characterization of dielectric material and liquid properties from RF to THz
Author :
Leyssenne, L. ; Wane, S. ; Massenot, S. ; Bajon, D. ; Coq-Germanicus, Rosine ; Descamps, Philippe ; Audoit, G.
Author_Institution :
LaMIPS Lab., Caen, France
Abstract :
This paper proposes a complementary multi-physics material analysis approach based on broadband dielectric characterization and Atomic Force Microscopy. In the prospect of integrated dielectric sensor design, this approach was applied to polymers commonly employed by various emerging technologies.
Keywords :
atomic force microscopy; dielectric materials; electromagnetic wave propagation; microwave measurement; nondestructive testing; atomic force microscopy; broadband dielectric characterization; complementary multiphysics material analysis; dielectric material; electromagnetic modeling; experimental characterization; integrated dielectric sensor design; liquid properties; Dielectrics; Materials; Microscopy; Microwave measurement; Permittivity; Permittivity measurement;
Conference_Titel :
Electromagnetics in Advanced Applications (ICEAA), 2013 International Conference on
Conference_Location :
Torino
Print_ISBN :
978-1-4673-5705-0
DOI :
10.1109/ICEAA.2013.6632399
