DocumentCode
3540163
Title
Electromagnetic modeling and experimental characterization of dielectric material and liquid properties from RF to THz
Author
Leyssenne, L. ; Wane, S. ; Massenot, S. ; Bajon, D. ; Coq-Germanicus, Rosine ; Descamps, Philippe ; Audoit, G.
Author_Institution
LaMIPS Lab., Caen, France
fYear
2013
fDate
9-13 Sept. 2013
Firstpage
1032
Lastpage
1035
Abstract
This paper proposes a complementary multi-physics material analysis approach based on broadband dielectric characterization and Atomic Force Microscopy. In the prospect of integrated dielectric sensor design, this approach was applied to polymers commonly employed by various emerging technologies.
Keywords
atomic force microscopy; dielectric materials; electromagnetic wave propagation; microwave measurement; nondestructive testing; atomic force microscopy; broadband dielectric characterization; complementary multiphysics material analysis; dielectric material; electromagnetic modeling; experimental characterization; integrated dielectric sensor design; liquid properties; Dielectrics; Materials; Microscopy; Microwave measurement; Permittivity; Permittivity measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetics in Advanced Applications (ICEAA), 2013 International Conference on
Conference_Location
Torino
Print_ISBN
978-1-4673-5705-0
Type
conf
DOI
10.1109/ICEAA.2013.6632399
Filename
6632399
Link To Document