DocumentCode
3540230
Title
Dielectric constant measurements of carbon based nanomaterials and silver nanowires at millimeter wave frequencies
Author
Lioubtchenko, D.V. ; Nefedova, I.I. ; Raisanen, Antti V.
Author_Institution
Sch. of Electr. Eng., Dept. of Radio Sci. & Eng., Aalto Univ., Espoo, Finland
fYear
2013
fDate
9-13 Sept. 2013
Firstpage
1074
Lastpage
1076
Abstract
The aim of this work is to study dielectric properties of thin carbon nanotube and silver nanowire layers at 75-110 GHz frequency range. The method is based on S-parameter measurements of loaded and unloaded sapphire rod waveguides.
Keywords
carbon nanotubes; millimetre wave measurement; nanowires; permittivity measurement; sapphire; silver; waveguides; Al2O3; C; S-parameter measurements; carbon based nanomaterials; dielectric constant measurements; frequency 75 GHz to 110 GHz; loaded sapphire rod waveguides; millimeter wave frequencies; silver nanowires; thin carbon nanotube; unloaded sapphire rod waveguides; Dielectric measurement; Educational institutions; Frequency measurement; Loss measurement; Nanowires; Optical variables measurement; Positron emission tomography;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetics in Advanced Applications (ICEAA), 2013 International Conference on
Conference_Location
Torino
Print_ISBN
978-1-4673-5705-0
Type
conf
DOI
10.1109/ICEAA.2013.6632407
Filename
6632407
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