• DocumentCode
    3540618
  • Title

    Asymmetric halo CMOSFET to reduce static power dissipation with improved performance

  • Author

    Bansal, Aditya ; Roy, Kaushik

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
  • fYear
    2005
  • fDate
    23-26 May 2005
  • Firstpage
    1
  • Abstract
    The paper presents the benefits of asymmetric halo (AH) MOSFETs over conventional symmetric halo (SH) MOSFETs to reduce static leakage in CMOS circuits. Device doping profiles have been optimized to obtain minimum leakage at iso on-current. Static leakage in AH devices is suppressed (61% in NMOS and 90% in PMOSFET) due to reduced band-to-band tunneling current in reverse biased drain-substrate junctions. At iso on-current, the delay in an AH ring-oscillator reduces by 11% because of reduced drain junction capacitance.
  • Keywords
    CMOS logic circuits; MOSFET; integrated circuit technology; leakage currents; logic gates; CMOS circuits; CMOS logic gate; NMOSFET; PMOSFET; asymmetric halo CMOSFET; asymmetric halo MOSFET; band-to-band tunneling current; drain junction capacitance; iso oncurrent; leakage current; reverse biased drain-substrate junctions; ring-oscillator; static leakage; static power dissipation; symmetric halo MOSFET; CMOSFETs; Circuit simulation; Doping profiles; Electrons; Implants; MOSFETs; Power dissipation; Power engineering computing; Tunneling; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 2005. ISCAS 2005. IEEE International Symposium on
  • Print_ISBN
    0-7803-8834-8
  • Type

    conf

  • DOI
    10.1109/ISCAS.2005.1464509
  • Filename
    1464509