Title :
Integration of high voltage charge-pumps in a submicron standard CMOS process for programming analog floating-gate circuits
Author :
Hooper, Mark ; Kucic, Matt ; Hasler, Paul
Author_Institution :
Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
Abstract :
This paper presents integration of high voltage charge-pumps for programming analog floating-gate (FG) circuits in a standard 0.5 μm CMOS N-well double poly process. In this research two different Dickson charge-pumps are integrated for the control of electron tunneling and hot-electron injection in a floating-gate element. A six stage design implemented with Schottky rectifiers is used to modulate tunneling and a three stage design using high voltage transistors is used to modulate injection. Controlling the frequency of the Schottky charge-pump is an on-chip clock. The on-chip clock, a 7 stage ring oscillator was designed to operate to approximately 10 MHz for controlling the Schottky charge-pump. Experimental results of hot-electron injection, clock performance and electron tunneling are presented.
Keywords :
CMOS analogue integrated circuits; Schottky effect; clocks; frequency control; hot electron transistors; network topology; oscillators; power supply circuits; voltage control; 7 stage ring oscillator; Dickson charge-pumps; N-well double poly process; Schottky rectifiers; analog floating-gate circuits; electron tunneling control; floating-gate element; frequency control; high voltage charge-pumps; high voltage transistors; hot-electron injection; injection modulation; on-chip clock; programming; six stage design; submicron standard CMOS process; three stage design; CMOS analog integrated circuits; CMOS process; Charge pumps; Clocks; Frequency; Rectifiers; Ring oscillators; Secondary generated hot electron injection; Tunneling; Voltage;
Conference_Titel :
Circuits and Systems, 2005. ISCAS 2005. IEEE International Symposium on
Print_ISBN :
0-7803-8834-8
DOI :
10.1109/ISCAS.2005.1464540