Title :
An n-type silicon nanowire dot based single-electron transistor
Author :
Huang, Shaoyun ; Shimizu, Maki ; Fukata, Naoki ; Sekiguchi, Takashi ; Yamaguchi, Tomohiro ; Ishibashi, Koji
Author_Institution :
Adv. Device Lab., RIKEN, Wako, Japan
Abstract :
Featuring in diameters of nanometers and lengths of micrometers, single-crystal silicon nanowires (SiNW) demonstrate quasi one-dimension properties and are potentially applicated as building blocks for nanoscale electronics. Precisely controlling one single-electron in a SiNW is essential to manipulate the elementary charge and spin for information device operations. This can be implemented by a single-electron transistor (SET) configuration. This work reports on the realization of a chemically bottom-up made n-type SiNW based SET and the study of electron transport properties about it.
Keywords :
nanowires; silicon; single electron transistors; electron transport; n-type silicon nanowire dot based single-electron transistor; nanoscale electronics; single-crystal silicon nanowires; Capacitance; Chemicals; Nanoscale devices; Silicon; Single electron transistors; Stability; Substrates; Temperature; Tunneling; Voltage;
Conference_Titel :
Silicon Nanoelectronics Workshop, 2008. SNW 2008. IEEE
Conference_Location :
Honolulu, HI
Print_ISBN :
978-1-4244-2071-1
DOI :
10.1109/SNW.2008.5418430