• DocumentCode
    3541290
  • Title

    An n-type silicon nanowire dot based single-electron transistor

  • Author

    Huang, Shaoyun ; Shimizu, Maki ; Fukata, Naoki ; Sekiguchi, Takashi ; Yamaguchi, Tomohiro ; Ishibashi, Koji

  • Author_Institution
    Adv. Device Lab., RIKEN, Wako, Japan
  • fYear
    2008
  • fDate
    15-16 June 2008
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    Featuring in diameters of nanometers and lengths of micrometers, single-crystal silicon nanowires (SiNW) demonstrate quasi one-dimension properties and are potentially applicated as building blocks for nanoscale electronics. Precisely controlling one single-electron in a SiNW is essential to manipulate the elementary charge and spin for information device operations. This can be implemented by a single-electron transistor (SET) configuration. This work reports on the realization of a chemically bottom-up made n-type SiNW based SET and the study of electron transport properties about it.
  • Keywords
    nanowires; silicon; single electron transistors; electron transport; n-type silicon nanowire dot based single-electron transistor; nanoscale electronics; single-crystal silicon nanowires; Capacitance; Chemicals; Nanoscale devices; Silicon; Single electron transistors; Stability; Substrates; Temperature; Tunneling; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Silicon Nanoelectronics Workshop, 2008. SNW 2008. IEEE
  • Conference_Location
    Honolulu, HI
  • Print_ISBN
    978-1-4244-2071-1
  • Type

    conf

  • DOI
    10.1109/SNW.2008.5418430
  • Filename
    5418430