FOGBUSTER: an efficient algorithm for sequential test generation

Automatic test pattern generation yielding high fault coverage for CMOS circuits has received a wide attention in industry and academia for a long time. Scan techniques were used to break down the sequential ATPG problem to combinational test generation. As the overhead necessary for scan design can not be spent for all circuits, sequential test generation techniques gained importance. In this paper the FOGBUSTER (FOrward propaGation Backward jUstification Sequential Test genERation) algorithm is described and experimental results for the ISCAS ´89 benchmark circuits are shown. FOGBUSTER is a complete algorithm which makes use of a forward propagation technique which is more efficient in general than the backward propagation technique used in the well known BACK-algorithm