DocumentCode :
3541342
Title :
Joint deconvolution/segmentation of microscope images of materials
Author :
Kim, Dae Woo ; Comer, Mary L.
Author_Institution :
Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
fYear :
2012
fDate :
5-8 Aug. 2012
Firstpage :
688
Lastpage :
691
Abstract :
In this paper, we propose the joint deconvolution and segmentation of materials images by incorporating blurring information in the EM/MPM segmentation algorithm. In the segmentation of microscope images of materials, exact boundary precision is very important. But it is difficult to get good results if the images have some degradation obtained in the acquisition process. We incorporate prior knowledge of blurring degradation into the existing EM/MPM segmentation algorithm in order to improve segmentation results at object boundaries. Experimental results using materials datasets are presented to demonstrate the proposed method is effective for that purpose.
Keywords :
deconvolution; image segmentation; EM-MPM segmentation algorithm; acquisition process; blurring information; materials images; microscope images deconvolution; microscope images segmentation; Algorithm design and analysis; Deconvolution; Degradation; Image segmentation; Materials; Microscopy; Signal processing algorithms; EM/MPM algorithm; Segmentation; deconvolution;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Statistical Signal Processing Workshop (SSP), 2012 IEEE
Conference_Location :
Ann Arbor, MI
ISSN :
pending
Print_ISBN :
978-1-4673-0182-4
Electronic_ISBN :
pending
Type :
conf
DOI :
10.1109/SSP.2012.6319795
Filename :
6319795
Link To Document :
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