Title :
Analog circuit fault diagnosis using higher order cumulants
Author :
Yuan, Taiwen ; Xie, Yongle ; Chen, Guangju
Author_Institution :
Sch. of Mechatron. Eng., Univ. of Electron. Sci. & Technol. of China, Chengdu, China
Abstract :
An approach to analog circuit fault diagnosis using higher order cumulants (HOC) is described in this paper. Our system used a harmonic signal to excite the circuit under test (CUT), and then the response was putted into a Butter worth filter bank. For each subband filter, the output sequence was analyzed by higher order cumulants. Skewness, a 1-D slice of 3rd-order cumulant was used in the system as fault feature. The simulation results showed that this was an effective method for analog circuit diagnosis. The fault trend was distinguished also by this method. Moreover, the fault coverage was improved.
Keywords :
Butterworth filters; analogue circuits; fault simulation; higher order statistics; 1-D slice; Butterworth filter bank; analog circuit fault diagnosis; circuit-under-test; fault coverage; fault trend; harmonic signal; higher-order cumulants; output sequence; subband filter; third order cumulant skewness; Analog circuits; Circuit faults; Circuit simulation; Circuit testing; Fault diagnosis; Filter bank; Neural networks; Power harmonic filters; Signal processing algorithms; System testing; analog circuit; fault diagnosis; filter bank; higher order cumulant; skewness;
Conference_Titel :
Electronic Measurement & Instruments, 2009. ICEMI '09. 9th International Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-3863-1
Electronic_ISBN :
978-1-4244-3864-8
DOI :
10.1109/ICEMI.2009.5274117
