Analog circuit fault diagnosis using higher order cumulants

Author

Yuan, Taiwen ; Xie, Yongle ; Chen, Guangju

Author_Institution

Sch. of Mechatron. Eng., Univ. of Electron. Sci. & Technol. of China, Chengdu, China

fYear

2009

fDate

16-19 Aug. 2009

Abstract

An approach to analog circuit fault diagnosis using higher order cumulants (HOC) is described in this paper. Our system used a harmonic signal to excite the circuit under test (CUT), and then the response was putted into a Butter worth filter bank. For each subband filter, the output sequence was analyzed by higher order cumulants. Skewness, a 1-D slice of 3^rd-order cumulant was used in the system as fault feature. The simulation results showed that this was an effective method for analog circuit diagnosis. The fault trend was distinguished also by this method. Moreover, the fault coverage was improved.

Keywords

Butterworth filters; analogue circuits; fault simulation; higher order statistics; 1-D slice; Butterworth filter bank; analog circuit fault diagnosis; circuit-under-test; fault coverage; fault trend; harmonic signal; higher-order cumulants; output sequence; subband filter; third order cumulant skewness; Analog circuits; Circuit faults; Circuit simulation; Circuit testing; Fault diagnosis; Filter bank; Neural networks; Power harmonic filters; Signal processing algorithms; System testing; analog circuit; fault diagnosis; filter bank; higher order cumulant; skewness;

fLanguage

English

Publisher

ieee

Conference_Titel

Electronic Measurement & Instruments, 2009. ICEMI '09. 9th International Conference on

Conference_Location

Beijing

Print_ISBN

978-1-4244-3863-1

Electronic_ISBN

978-1-4244-3864-8

Type

conf

DOI

10.1109/ICEMI.2009.5274117

Filename

5274117