Title :
Multifractal analysis of self-similar processes
Author :
Wendt, H. ; Jaffard, S. ; Abry, P.
Author_Institution :
IRIT, ENSEEIHT, Toulouse, France
Abstract :
Scale invariance and multifractal analysis are nowadays widely used in applications. For modeling scale invariance in data, two classes of processes are classically in competition: self-similar processes and multiplicative cascades. They imply fundamentally different underlying (additive or multiplicative) mechanisms, hence the crucial practical need for data driven model selection. Such identification relies on properties often associated with the former: self-similarity, monofractality, linear scaling function, null c2 parameter. By performing a wavelet leader based analysis of the multifractal properties of a large variety of self-similar processes, the present work contributes to a better disentangling of these different properties, sometimes confused one with another. Also, it leads to the formulation of conjectures regarding the scaling and multifractal properties of self-similar processes.
Keywords :
data analysis; fractals; data analysis; data driven model selection; linear scaling function; monofractality; multifractal analysis; multifractal properties; multiplicative cascades; null c2 parameter; scale invariance; self-similar processes; wavelet leader based analysis; Data models; Estimation; Fractals; Upper bound; Wavelet analysis; Wavelet transforms; monofractal; multifractal analysis; scaling function; self-similar; wavelet leader;
Conference_Titel :
Statistical Signal Processing Workshop (SSP), 2012 IEEE
Conference_Location :
Ann Arbor, MI
Print_ISBN :
978-1-4673-0182-4
Electronic_ISBN :
pending
DOI :
10.1109/SSP.2012.6319798