• DocumentCode
    3541448
  • Title

    Three-dimensional super-chip integration technology using self-assembly technique

  • Author

    Koyanagi, Mitsumasa ; Fukushima, Takafumi ; Tanaka, Tetsu

  • Author_Institution
    Dept. of Bioeng. & Robot., Tohoku Univ., Sendai, Japan
  • fYear
    2008
  • fDate
    15-16 June 2008
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    We proposed a new three-dimensional (3-D) super-chip integration technology using self-assembly technique. Many chips are simultaneously aligned and bonded onto lower chips using a self-assembly technique in a super-chip integration. It was confirmed that Si chips with sizes of 1 mm square to 5 mm square were precisely assembled on Si wafers with high alignment accuracy of less than 0.5 ¿m. We have fabricated 3-D LSI test chips by a super-chip integration technology.
  • Keywords
    assembling; integrated circuit testing; large scale integration; silicon; three-dimensional integrated circuits; 3D LSI test chips; 3D super-chip integration technology; Si; self-assembly technique; silicon chips; silicon wafers; Current measurement; Electrons; Germanium silicon alloys; Heart; Isotopes; Modems; Physics; Quantum dots; Self-assembly; Silicon germanium;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Silicon Nanoelectronics Workshop, 2008. SNW 2008. IEEE
  • Conference_Location
    Honolulu, HI
  • Print_ISBN
    978-1-4244-2071-1
  • Type

    conf

  • DOI
    10.1109/SNW.2008.5418453
  • Filename
    5418453