Title :
Three-dimensional super-chip integration technology using self-assembly technique
Author :
Koyanagi, Mitsumasa ; Fukushima, Takafumi ; Tanaka, Tetsu
Author_Institution :
Dept. of Bioeng. & Robot., Tohoku Univ., Sendai, Japan
Abstract :
We proposed a new three-dimensional (3-D) super-chip integration technology using self-assembly technique. Many chips are simultaneously aligned and bonded onto lower chips using a self-assembly technique in a super-chip integration. It was confirmed that Si chips with sizes of 1 mm square to 5 mm square were precisely assembled on Si wafers with high alignment accuracy of less than 0.5 ¿m. We have fabricated 3-D LSI test chips by a super-chip integration technology.
Keywords :
assembling; integrated circuit testing; large scale integration; silicon; three-dimensional integrated circuits; 3D LSI test chips; 3D super-chip integration technology; Si; self-assembly technique; silicon chips; silicon wafers; Current measurement; Electrons; Germanium silicon alloys; Heart; Isotopes; Modems; Physics; Quantum dots; Self-assembly; Silicon germanium;
Conference_Titel :
Silicon Nanoelectronics Workshop, 2008. SNW 2008. IEEE
Conference_Location :
Honolulu, HI
Print_ISBN :
978-1-4244-2071-1
DOI :
10.1109/SNW.2008.5418453