DocumentCode
3541448
Title
Three-dimensional super-chip integration technology using self-assembly technique
Author
Koyanagi, Mitsumasa ; Fukushima, Takafumi ; Tanaka, Tetsu
Author_Institution
Dept. of Bioeng. & Robot., Tohoku Univ., Sendai, Japan
fYear
2008
fDate
15-16 June 2008
Firstpage
1
Lastpage
2
Abstract
We proposed a new three-dimensional (3-D) super-chip integration technology using self-assembly technique. Many chips are simultaneously aligned and bonded onto lower chips using a self-assembly technique in a super-chip integration. It was confirmed that Si chips with sizes of 1 mm square to 5 mm square were precisely assembled on Si wafers with high alignment accuracy of less than 0.5 ¿m. We have fabricated 3-D LSI test chips by a super-chip integration technology.
Keywords
assembling; integrated circuit testing; large scale integration; silicon; three-dimensional integrated circuits; 3D LSI test chips; 3D super-chip integration technology; Si; self-assembly technique; silicon chips; silicon wafers; Current measurement; Electrons; Germanium silicon alloys; Heart; Isotopes; Modems; Physics; Quantum dots; Self-assembly; Silicon germanium;
fLanguage
English
Publisher
ieee
Conference_Titel
Silicon Nanoelectronics Workshop, 2008. SNW 2008. IEEE
Conference_Location
Honolulu, HI
Print_ISBN
978-1-4244-2071-1
Type
conf
DOI
10.1109/SNW.2008.5418453
Filename
5418453
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