DocumentCode :
3541461
Title :
Observation of quantum level spectrum for silicon double single-electron transistors
Author :
Kawata, Y. ; Yamaguchi, T. ; Ishibashi, K. ; Tsuchiya, Y. ; Oda, S. ; Mizuta, H.
fYear :
2008
fDate :
15-16 June 2008
Firstpage :
1
Lastpage :
2
Abstract :
Double quantum dots (DQDs) have been studied as attractive candidates for charge qubits. Initially, GaAs-based DQDs formed by means of surface gates depletion were studied because many parameters are tunable after their fabrications [1]. However, silicon-based DQDs are more promising for charge qubits because of the absence ofpiezoelectric electron-phonon coupling, and the effect of phonon localization [2]. Furthermore, to integrate Si multiple charge qubits and a readout device in a small footprint, a series-connected double dots transistor has recently been proposed and studied [3]. The readout is called as double single-electron transistors (DSETs) and facilitates to detect the single-charge polarizations on the adjacent double qubits efficiently [4]. The other advantage of DSETs is that both two SETs act as feedback transistors to each other to compensate the random fluctuation noise.
Keywords :
feedback; readout electronics; semiconductor quantum dots; single electron transistors; charge qubits; double quantum dots; fabrications; feedback transistors; quantum level spectrum; readout; series-connected double dots transistor; silicon double single-electron transistors; Current measurement; Germanium silicon alloys; Heart; Isotopes; Modems; Physics; Quantum dots; Silicon germanium; Single electron transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Silicon Nanoelectronics Workshop, 2008. SNW 2008. IEEE
Conference_Location :
Honolulu, HI
Print_ISBN :
978-1-4244-2071-1
Type :
conf
DOI :
10.1109/SNW.2008.5418455
Filename :
5418455
Link To Document :
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