• DocumentCode
    3541545
  • Title

    Control of single dopants in the electron conduction path in SOI doped-nanowire FETs

  • Author

    Moraru, D. ; Nagata, D. ; Yokoi, K. ; Ebisawa, K. ; Tabe, M.

  • Author_Institution
    Res. Inst. of Electron., Shizuoka Univ., Hamamatsu, Japan
  • fYear
    2008
  • fDate
    15-16 June 2008
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    We demonstrated that in SOI-PETs with doped-nanowire channel, both top gate and back gate can be used for adjusting the potential profile. New diamonds correspond to addition of dopants in the conduction path. Control of the conduction path with single-dopant accuracy allows the optimization of the dopant-induced QD structure. One possible application is toward improving the controllability of single-electron transfer in otherwise naturally disordered dopant arrays.
  • Keywords
    diamond; field effect transistors; nanowires; silicon-on-insulator; SOI; back gate; diamonds; dopant-induced QD structure; doped-nanowire FET; electron conduction path; single dopants; single-electron transfer; top gate; Control systems; Doping; Electrons; FETs; Fluctuations; Nanoscale devices; Quantum dots; Stability; Switches; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Silicon Nanoelectronics Workshop, 2008. SNW 2008. IEEE
  • Conference_Location
    Honolulu, HI
  • Print_ISBN
    978-1-4244-2071-1
  • Type

    conf

  • DOI
    10.1109/SNW.2008.5418467
  • Filename
    5418467