DocumentCode :
3541545
Title :
Control of single dopants in the electron conduction path in SOI doped-nanowire FETs
Author :
Moraru, D. ; Nagata, D. ; Yokoi, K. ; Ebisawa, K. ; Tabe, M.
Author_Institution :
Res. Inst. of Electron., Shizuoka Univ., Hamamatsu, Japan
fYear :
2008
fDate :
15-16 June 2008
Firstpage :
1
Lastpage :
2
Abstract :
We demonstrated that in SOI-PETs with doped-nanowire channel, both top gate and back gate can be used for adjusting the potential profile. New diamonds correspond to addition of dopants in the conduction path. Control of the conduction path with single-dopant accuracy allows the optimization of the dopant-induced QD structure. One possible application is toward improving the controllability of single-electron transfer in otherwise naturally disordered dopant arrays.
Keywords :
diamond; field effect transistors; nanowires; silicon-on-insulator; SOI; back gate; diamonds; dopant-induced QD structure; doped-nanowire FET; electron conduction path; single dopants; single-electron transfer; top gate; Control systems; Doping; Electrons; FETs; Fluctuations; Nanoscale devices; Quantum dots; Stability; Switches; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Silicon Nanoelectronics Workshop, 2008. SNW 2008. IEEE
Conference_Location :
Honolulu, HI
Print_ISBN :
978-1-4244-2071-1
Type :
conf
DOI :
10.1109/SNW.2008.5418467
Filename :
5418467
Link To Document :
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