Title :
White noise characteristics of nanoscale MOSFETs in all operating regions
Author :
Jongwook Jeon ; Park, Byung-Gook ; Lee, Long Duk ; Shin, Hyungcheol
Author_Institution :
ISRC, Seoul Nat. Univ., Seoul, South Korea
Abstract :
In this paper, the white noise characteristics of nanoscale MOSFETs are presented in all operation regions. The measured drain current noise data are compared with power spectral density of shot-like and thermal noise models. The experimental results show that drain current noise is shot-like in weak inversion region and thermal noise in strong inversion region even at 36 nm gate length.
Keywords :
MOSFET; nanotechnology; thermal noise; white noise; drain current noise; nanoscale MOSFET; power spectral density; shot-like model; thermal noise; white noise; 1f noise; Circuit noise; Current measurement; Equations; Low-frequency noise; MOSFETs; Noise level; Noise measurement; Semiconductor device noise; White noise;
Conference_Titel :
Silicon Nanoelectronics Workshop, 2008. SNW 2008. IEEE
Conference_Location :
Honolulu, HI
Print_ISBN :
978-1-4244-2071-1
DOI :
10.1109/SNW.2008.5418476
