DocumentCode :
3541715
Title :
Flexible waveguide probe for silicon-photonics wafer-level test
Author :
Panepucci, Roberto R. ; Zakariya, Abdullah J. ; Kudapa, Lavanya V K
Author_Institution :
Centro de Tecnol. da Informacao Renato Archer, Ministerio de Cienc. e Tecnol., Campinas, Brazil
fYear :
2011
fDate :
Oct. 29 2011-Nov. 1 2011
Firstpage :
111
Lastpage :
113
Abstract :
We extend our flexible probe approach to enable optical coupling into planar lightwave circuits (PLCs) in high-contrast silicon photonic platform. A flexible waveguide is used to form a variable length directional coupler that inserts/extracts light from a waveguide in the wafer to the probe. Varying the length enables optimal coupling to be achieved for a wide range of probe-to-waveguide gap, materials, widths and cladding thicknesses present on a chip. In this paper we consider simulations of two designs for coupling into silicon single mode waveguides, one based on polymer waveguide and another based on silicon waveguides. Polymer coupling into nanowire waveguides allows 75% coupling, whereas silicon probe reaches 95%. The results also indicate that this approach is ideal for characterizing PLC´s as the 3dB bandwidth of the probe covers the whole 1300-1700 nm fiber-optic telecommunication range. Challenging coupling length control in the range of 5-50 μm is required.
Keywords :
optical communication equipment; optical directional couplers; optical planar waveguides; optical polymers; optical testing; probes; silicon; PLC; Si; cladding thicknesses; fiber optic telecommunication range; flexible waveguide probe; high contrast silicon photonic platform; optical coupling; planar lightwave circuit; polymer waveguide; probe-to-waveguide gap; silicon photonics wafer level test; single mode waveguide; variable length directional coupler; wavelength 1300 nm to 1700 nm; Couplings; Optical coupling; Optical fibers; Probes; Silicon; Flexible waveguides; fiber-coupling; optical testing; silicon-photonics;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave & Optoelectronics Conference (IMOC), 2011 SBMO/IEEE MTT-S International
Conference_Location :
Natal
ISSN :
Pending
Print_ISBN :
978-1-4577-1662-1
Type :
conf
DOI :
10.1109/IMOC.2011.6169336
Filename :
6169336
Link To Document :
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