DocumentCode :
3541765
Title :
An LSI system with locked in temperature insensitive state achieved by using body bias technique
Author :
Ono, Goichi ; Miyazaki, Masayuki ; Watanabe, Kazuki ; Kawahara, Takayuki
Author_Institution :
Central Res. Lab., Hitachi, Ltd, Tokyo, Japan
fYear :
2005
fDate :
23-26 May 2005
Firstpage :
632
Abstract :
Forward-body-bias (FBB) technology can compensate performance fluctuation in LSIs for low-voltage-operation. However, because the FBB characteristics depend on the temperature, the FBB control effect is decreased at high temperatures. A temperature insensitive state (TIS) for supply voltage improves the LSI performance as a solution of the dependence of the FBB characteristics on temperature. When an LSI is operated in a TIS, the performance fluctuation is fixed in a low temperature condition. We propose a TIS locking circuit that achieves TIS operation and reduces performance fluctuation. The circuit achieves this by detecting the threshold voltage and generating a voltage proportional to temperature. Compensating TIS decreased performance fluctuation and power consumption of an LSI to one-third of those before TIS control was applied.
Keywords :
electric potential; integrated circuit design; large scale integration; low-power electronics; microprocessor chips; power consumption; temperature; ubiquitous computing; LSI system; forward-body-bias technology; locked in temperature insensitive state; low-power operation; low-voltage-operation; performance fluctuation; power consumption; supply voltage; ubiquitous computing processor; Bipolar transistors; CMOS technology; Circuits; Fluctuations; Large scale integration; Power supplies; Temperature control; Temperature dependence; Ubiquitous computing; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems, 2005. ISCAS 2005. IEEE International Symposium on
Print_ISBN :
0-7803-8834-8
Type :
conf
DOI :
10.1109/ISCAS.2005.1464667
Filename :
1464667
Link To Document :
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