Title :
External photoconductive sampling up to 1 THz
Author :
Heiliger, H.-M. ; Vortmeier, G. ; Kurz, H.
Author_Institution :
Inst. fur Halbleitertech. II, Tech. Hochschule Aachen, Germany
Abstract :
Summary form only given. Photoconductive (PC) sampling is regarded as a powerful tool for characterization of ultrahigh-frequency electronic devices. However, up to now, mostly the detection of single pulses of fairly short duration around 2.3 ps have been shown. Thus, there is real need to demonstrate the capability of this method for device characterization in the same way as for electro-optic (EO) sampling. Here, we present the characterization of a 50-/spl Omega/ impedance thin-film microstrip line (TFMSL) by means of an external PC probe.
Keywords :
high-speed optical techniques; microstrip lines; photoconducting devices; 2.3 ps; 50 ohm; Si; Ti-Au; device characterization; electro-optic sampling; external PC probe; external photoconductive sampling; short pulse duration; single pulse detection; thin-film microstrip line; ultrahigh-frequency electronic devices; Bandwidth; Cameras; High speed optical techniques; Integrated optics; Optical modulation; Optical waveguides; Packaging; Photoconductivity; Sampling methods; Voltage;
Conference_Titel :
Lasers and Electro-Optics, 1998. CLEO 98. Technical Digest. Summaries of papers presented at the Conference on
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
1-55752-339-0
DOI :
10.1109/CLEO.1998.676144
