External photoconductive sampling up to 1 THz

Author

Heiliger, H.-M. ; Vortmeier, G. ; Kurz, H.

Author_Institution

Inst. fur Halbleitertech. II, Tech. Hochschule Aachen, Germany

fYear

1998

fDate

3-8 May 1998

Firstpage

263

Lastpage

264

Abstract

Summary form only given. Photoconductive (PC) sampling is regarded as a powerful tool for characterization of ultrahigh-frequency electronic devices. However, up to now, mostly the detection of single pulses of fairly short duration around 2.3 ps have been shown. Thus, there is real need to demonstrate the capability of this method for device characterization in the same way as for electro-optic (EO) sampling. Here, we present the characterization of a 50-/spl Omega/ impedance thin-film microstrip line (TFMSL) by means of an external PC probe.

Keywords

high-speed optical techniques; microstrip lines; photoconducting devices; 2.3 ps; 50 ohm; Si; Ti-Au; device characterization; electro-optic sampling; external PC probe; external photoconductive sampling; short pulse duration; single pulse detection; thin-film microstrip line; ultrahigh-frequency electronic devices; Bandwidth; Cameras; High speed optical techniques; Integrated optics; Optical modulation; Optical waveguides; Packaging; Photoconductivity; Sampling methods; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Lasers and Electro-Optics, 1998. CLEO 98. Technical Digest. Summaries of papers presented at the Conference on

Conference_Location

San Francisco, CA, USA

Print_ISBN

1-55752-339-0

Type

conf

DOI

10.1109/CLEO.1998.676144

Filename

676144