DocumentCode :
3541921
Title :
High-precision battery test system based on 24-bit ADC
Author :
Shen, Ruijie ; Chen, Rujun ; Huang, Zheyuan
Author_Institution :
Sch. of Info-Phys. & Geomatics Eng., Central South Univ., Changsha, China
fYear :
2009
fDate :
16-19 Aug. 2009
Abstract :
This paper presents an intelligent secondary battery test system based on a 24-bit high-resolution ADC ADS1211. We adopt ultra-high precision voltage reference AD780 and 24-bit ADC ADS1211 to ensure high-precision measurement. The system utilizes a micro-controller to intelligently set the parameters of channel state control circuit, switch charge-discharge mode, switch voltage and current feedback, control voltage and current sampling, test internal resistance of a battery cell, measure the ambient temperature, etc. This system achieves the functions of testing rechargeable battery, including constant current charge, constant voltage charge, constant current discharge and static performance, and the high precision measurement of secondary battery parameters. Furthermore, based on the test result we can analysis the comprehensive performance of the secondary battery and achieve a reasonable battery match to play the best performance. The main characteristics of the system are simple circuit, low cost, multi-function and high precision.
Keywords :
analogue-digital conversion; constant current sources; microcontrollers; secondary cells; ADC ADS1211; channel state control circuit; constant current charge; constant current discharge; constant voltage charge; high-precision measurement; intelligent secondary battery test system; microcontroller; rechargeable battery; secondary battery parameters; switch charge-discharge mode; voltage reference AD780; word length 24 bit; Battery charge measurement; Circuit testing; Control systems; Current measurement; Electrical resistance measurement; Switches; Switching circuits; System testing; Temperature control; Voltage control; 24-bit ADC; AD780; ADS1211; battery testing; internal resistance testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Measurement & Instruments, 2009. ICEMI '09. 9th International Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-3863-1
Electronic_ISBN :
978-1-4244-3864-8
Type :
conf
DOI :
10.1109/ICEMI.2009.5274195
Filename :
5274195
Link To Document :
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