• DocumentCode
    3542006
  • Title

    Life-time limited dephasing time of confined exciton on CuCl quantum dots

  • Author

    Inoue, K. ; Kuribayashi, R. ; Sakoda, K. ; Baranov, A.V.

  • Author_Institution
    Res. Inst. for Electron. Sci., Hokkaido Univ., Sapporo, Japan
  • fYear
    1998
  • fDate
    3-8 May 1998
  • Firstpage
    266
  • Abstract
    Summary form only given. The dephasing time T/sub 2/ of an exciton in the weak confinement regime in semiconductor quantum dots (QDs) is expected to be quite long, or equivalently, the electronic structure should be composed of discrete ultranarrow or atomic-like levels. These characteristics are very attractive for potential application of QDs to devices. In view of no observation of such a long T/sub 2/ value, we directly measured T/sub 2/ of confined excitons in CuCl QDs by using both a degenerate fourwave-mixing (FWM) and a heterodyne photon echo (HPE) experiment, using very weak pumping power.
  • Keywords
    II-VI semiconductors; copper compounds; excitons; multiwave mixing; photon echo; semiconductor quantum dots; CuCI QDs; CuCl; CuCl quantum dots; confined exciton; confined excitons; degenerate fourwave-mixing; discrete ultranarrow levels; electronic structure; heterodyne photon echo; life-time limited dephasing time; long T/sub 2/ value; semiconductor quantum dots; very weak pumping power; weak confinement regime; Absorption; Atomic measurements; Delay effects; Excitons; Glass; Power measurement; Pulse measurements; Quantum dots; Temperature; US Department of Transportation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics, 1998. CLEO 98. Technical Digest. Summaries of papers presented at the Conference on
  • Conference_Location
    San Francisco, CA, USA
  • Print_ISBN
    1-55752-339-0
  • Type

    conf

  • DOI
    10.1109/CLEO.1998.676147
  • Filename
    676147