On-chip built-in self-test of video-rate ADCs using Gaussian noise

This paper presents a new method to perform built-in-self-test (BIST) to measure the DNL, INL and the output noise of an ADC. The technique uses a Gaussian noise source as input stimulus and a simple algorithm based in precalculated tables (on-chip ROMs) for the DNL and INL tests. The results of the proposed BIST algorithm are compared with other standard tests. The simplicity of the digital circuitry together with other advantages pointed-out, clearly demonstrate the attractiveness of the proposed technique.