DocumentCode :
3542326
Title :
A new approach of a precise electric modeling of the semiconductors and dielectrics
Author :
Malaoui, Abdessamad ; Bendada, Elmaati ; Mabrouki, Mustapha ; Ankrim, Mohamed ; Quotb, Kamal
Author_Institution :
Lab. Geni Industriel, Univ. Sultan Moulay Slimane, Beni Mellal, Morocco
fYear :
2009
fDate :
19-22 Dec. 2009
Firstpage :
232
Lastpage :
235
Abstract :
A new method is developed in this work, to seek precise and simple electric models of physical samples. This technique is based on the decomposition of the electric impedance in a series of the elementary electrical circuits. Algorithm and software programs are developed to estimate the order and the number of these basic circuits. Tests are applied on a BST ceramics and Schottky junction. The founding electric models are compared with other models, often used in the literature. Interesting results are observed on the level of the statistical errors and the various significant elements of the models.
Keywords :
RC circuits; Schottky diodes; aluminium; barium compounds; ceramics; conducting polymers; electric impedance; indium compounds; organic semiconductors; semiconductor device models; strontium compounds; tin compounds; Al; BST ceramics; Ba1-xSrxTiO3; ITO; RC-circuit model; Schottky junction; basic circuits; electric impedance; electric modeling; elementary electrical circuits; software programs; statistical errors; Binary search trees; Ceramics; Circuit testing; Dielectrics; Electric resistance; Immune system; Impedance; Instruments; Mathematical model; RLC circuits; Electric modeling; LVM algorithm; RLC-circuit; semiconductor;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microelectronics (ICM), 2009 International Conference on
Conference_Location :
Marrakech
Print_ISBN :
978-1-4244-5814-1
Type :
conf
DOI :
10.1109/ICM.2009.5418644
Filename :
5418644
Link To Document :
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