• DocumentCode
    3542326
  • Title

    A new approach of a precise electric modeling of the semiconductors and dielectrics

  • Author

    Malaoui, Abdessamad ; Bendada, Elmaati ; Mabrouki, Mustapha ; Ankrim, Mohamed ; Quotb, Kamal

  • Author_Institution
    Lab. Geni Industriel, Univ. Sultan Moulay Slimane, Beni Mellal, Morocco
  • fYear
    2009
  • fDate
    19-22 Dec. 2009
  • Firstpage
    232
  • Lastpage
    235
  • Abstract
    A new method is developed in this work, to seek precise and simple electric models of physical samples. This technique is based on the decomposition of the electric impedance in a series of the elementary electrical circuits. Algorithm and software programs are developed to estimate the order and the number of these basic circuits. Tests are applied on a BST ceramics and Schottky junction. The founding electric models are compared with other models, often used in the literature. Interesting results are observed on the level of the statistical errors and the various significant elements of the models.
  • Keywords
    RC circuits; Schottky diodes; aluminium; barium compounds; ceramics; conducting polymers; electric impedance; indium compounds; organic semiconductors; semiconductor device models; strontium compounds; tin compounds; Al; BST ceramics; Ba1-xSrxTiO3; ITO; RC-circuit model; Schottky junction; basic circuits; electric impedance; electric modeling; elementary electrical circuits; software programs; statistical errors; Binary search trees; Ceramics; Circuit testing; Dielectrics; Electric resistance; Immune system; Impedance; Instruments; Mathematical model; RLC circuits; Electric modeling; LVM algorithm; RLC-circuit; semiconductor;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microelectronics (ICM), 2009 International Conference on
  • Conference_Location
    Marrakech
  • Print_ISBN
    978-1-4244-5814-1
  • Type

    conf

  • DOI
    10.1109/ICM.2009.5418644
  • Filename
    5418644