DocumentCode
3542326
Title
A new approach of a precise electric modeling of the semiconductors and dielectrics
Author
Malaoui, Abdessamad ; Bendada, Elmaati ; Mabrouki, Mustapha ; Ankrim, Mohamed ; Quotb, Kamal
Author_Institution
Lab. Geni Industriel, Univ. Sultan Moulay Slimane, Beni Mellal, Morocco
fYear
2009
fDate
19-22 Dec. 2009
Firstpage
232
Lastpage
235
Abstract
A new method is developed in this work, to seek precise and simple electric models of physical samples. This technique is based on the decomposition of the electric impedance in a series of the elementary electrical circuits. Algorithm and software programs are developed to estimate the order and the number of these basic circuits. Tests are applied on a BST ceramics and Schottky junction. The founding electric models are compared with other models, often used in the literature. Interesting results are observed on the level of the statistical errors and the various significant elements of the models.
Keywords
RC circuits; Schottky diodes; aluminium; barium compounds; ceramics; conducting polymers; electric impedance; indium compounds; organic semiconductors; semiconductor device models; strontium compounds; tin compounds; Al; BST ceramics; Ba1-xSrxTiO3; ITO; RC-circuit model; Schottky junction; basic circuits; electric impedance; electric modeling; elementary electrical circuits; software programs; statistical errors; Binary search trees; Ceramics; Circuit testing; Dielectrics; Electric resistance; Immune system; Impedance; Instruments; Mathematical model; RLC circuits; Electric modeling; LVM algorithm; RLC-circuit; semiconductor;
fLanguage
English
Publisher
ieee
Conference_Titel
Microelectronics (ICM), 2009 International Conference on
Conference_Location
Marrakech
Print_ISBN
978-1-4244-5814-1
Type
conf
DOI
10.1109/ICM.2009.5418644
Filename
5418644
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