Title :
Closeness metrics for system-level functional partitioning
Author :
Vahid, Frank ; Gajski, Daniel D.
Author_Institution :
Dept. of Comput. Sci., California Univ., Riverside, CA, USA
Abstract :
An important system design task is the partitioning of system functionality for implementation among multiple system components, including partitions among hardware and software components. We present a set of closeness metrics to aid such partitioning. These metrics can be used by a designer or by automated algorithms, to cluster together functional objects that should be implemented on the same component. We summarize experiments for determining the best combination of metrics for particular uses, and we demonstrate the advantages of clustering with the closeness metrics before applying hardware or hardware/software partitioning
Keywords :
circuit layout CAD; integrated circuit layout; logic CAD; logic partitioning; closeness metrics; functional objects; hardware/software partitioning; system design task; system functionality; system-level functional partitioning; Algorithm design and analysis; Application specific integrated circuits; Asynchronous transfer mode; Clustering algorithms; Computer science; Hardware; Partitioning algorithms; Software standards; Switching systems; Time factors;
Conference_Titel :
Design Automation Conference, 1995, with EURO-VHDL, Proceedings EURO-DAC '95., European
Conference_Location :
Brighton
Print_ISBN :
0-8186-7156-4
DOI :
10.1109/EURDAC.1995.527425