DocumentCode
3542389
Title
A scalable, flexible workflow for MethylCap-seq data analysis
Author
Rodriguez, Benjamin ; Tam, Hok-Hei ; Frankhouser, David ; Trimarchi, Michael ; Murphy, Mark ; Kuo, Chris ; Parikh, Deval ; Ball, Bryan ; Schwind, Sebastian ; Curfman, John ; Blum, William ; Marcucci, Guido ; Yan, Pearlly ; Bundschuh, Ralf
Author_Institution
Ohio State Univ. Comprehensive Cancer Center, Columbus, OH, USA
fYear
2011
fDate
4-6 Dec. 2011
Firstpage
1
Lastpage
4
Abstract
Advances in whole genome profiling have revolutionized the cancer research field, but at the same time have raised new bioinformatics challenges. For next generation sequencing (NGS), these include data storage, computational costs, sequence processing and alignment, delineating appropriate statistical measures, and data visualization. The NGS application MethylCap-seq involves the in vitro capture of methylated DNA and subsequent analysis of enriched fragments by massively parallel sequencing. Here, we present a scalable, flexible workflow for MethylCap-seq Quality Control, secondary data analysis, tertiary analysis of multiple experimental groups, and data visualization. This workflow and its suite of features will assist biologists in conducting methylation profiling projects and facilitate meaningful biological interpretation.
Keywords
DNA; bioinformatics; data analysis; data visualisation; genomics; quality control; statistical analysis; MethylCap-Seq data analysis; MethylCap-seq quality control; NGS application; bioinformatics challenges; biological interpretation; cancer research field; computational costs; data storage; data visualization; flexible workflow; methylation profiling projects; next generation sequencing; parallel sequencing; sequence processing; subsequent analysis; Bioinformatics; Cancer; DNA; Data visualization; Genomics; Heating; DNA methylation; cancer; data analysis; data visualization; epigenetics; next generation sequencing;
fLanguage
English
Publisher
ieee
Conference_Titel
Genomic Signal Processing and Statistics (GENSIPS), 2011 IEEE International Workshop on
Conference_Location
San Antonio, TX
ISSN
2150-3001
Print_ISBN
978-1-4673-0491-7
Electronic_ISBN
2150-3001
Type
conf
DOI
10.1109/GENSiPS.2011.6169426
Filename
6169426
Link To Document