DocumentCode
3542590
Title
Efficient cancer therapy using Boolean networks and Max-SAT-based ATPG
Author
Lin, Pey-Chang Kent ; Khatri, Sunil P.
Author_Institution
Dept. of ECE, Texas A&M Univ., College Station, TX, USA
fYear
2011
fDate
4-6 Dec. 2011
Firstpage
87
Lastpage
90
Abstract
Cancer and other gene related diseases are usually caused by a failure in the signaling pathway between genes and cells. These failures can occur in different areas of the gene regulatory network, but can be abstracted as faults in the regulatory function. For effective cancer treatment, it is imperative to identify faults and select appropriate drugs to treat the fault. In this paper, we present an extensible Max-SAT based automatic test pattern generation (ATPG) algorithm for cancer therapy. This ATPG algorithm is based on Boolean Satisfiability (SAT) and utilizes the stuck-at fault model for representing signalling faults. A weighted partial Max-SAT formulation is used to enable selection of the most effective drug. Several usage cases as presented for fault identification and drug selection. These include the identification of testable faults, optimal drug selection for single/multiple known faults, and optimal drug selection for overall fault coverage. Experimental results on growth factor (GF) signaling pathways demonstrate that our algorithm is flexible, and can yield an exact solution for each feature in much less than 1 second.
Keywords
Boolean algebra; automatic test pattern generation; cancer; computability; drugs; gene therapy; genetics; medical computing; Boolean networks; Boolean satisfiability; Max-SAT-based ATPG; automatic test pattern generation algorithm; cancer therapy; cancer treatment; fault identification; gene related diseases; optimal drug selection; signaling pathway; signalling fault representation; stuck-at fault model; weighted partial Max-SAT formulation; Cancer; Circuit faults; Drugs; Integrated circuit modeling; Logic gates; Vectors;
fLanguage
English
Publisher
ieee
Conference_Titel
Genomic Signal Processing and Statistics (GENSIPS), 2011 IEEE International Workshop on
Conference_Location
San Antonio, TX
ISSN
2150-3001
Print_ISBN
978-1-4673-0491-7
Electronic_ISBN
2150-3001
Type
conf
DOI
10.1109/GENSiPS.2011.6169450
Filename
6169450
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