• DocumentCode
    3542767
  • Title

    High resolution multi-channel voltage reference generator for experiments on quantum-dot devices

  • Author

    Huang, Dajun ; Wang, Yonggang ; Zhang, Lijun ; Zhou, Cheng ; Hao, Xiaojie

  • Author_Institution
    Dept. of Modern Phys., Univ. of Sci. & Technol. of China, Hefei, China
  • fYear
    2009
  • fDate
    16-19 Aug. 2009
  • Abstract
    High precision, multiple channel, fine tunable voltage references are often required for experiments on quantum-dot devices for controlling the electron states to form specific structure. A fiber-ring based multi-channel voltage reference generator for these experiments is designed and constructed. The generator adopts 20-bit DACs and amplifiers producing high resolution voltages ranging from -10 V to 0 V. By specific fiber-ring structure, several generators may be cascaded together to provide the required number of channels. A number of methods, which effectively constrain the noise level and temperature influence, are also described in the paper. The test results show that the generator has a drift less than 6 ppm/degC of FSR and voltage noise of 3.8 muVms, which is well suitable for our present experiments on quantum-dot devices.
  • Keywords
    amplifiers; digital-analogue conversion; nanoelectronics; reference circuits; semiconductor devices; semiconductor quantum dots; voltage control; 20-bit DAC; amplifiers; digital-to-analog converters; fiber-ring based multichannel voltage reference generator; high resolution multichannel voltage reference generator; noise level; quantum dot devices; voltage -10 V to 10 V; CMOS technology; Electrons; Noise level; Optical fiber devices; Optical fiber testing; Quantum dots; Quantum mechanics; Semiconductor device noise; Tunable circuits and devices; Voltage control; DAC1220; fiber-ring; gate-voltage; low drift; low noise; quantum-dot devices;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Measurement & Instruments, 2009. ICEMI '09. 9th International Conference on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4244-3863-1
  • Electronic_ISBN
    978-1-4244-3864-8
  • Type

    conf

  • DOI
    10.1109/ICEMI.2009.5274301
  • Filename
    5274301