DocumentCode :
3543227
Title :
Award presentations - Plenary session award
fYear :
2012
fDate :
10-13 Dec. 2012
Firstpage :
1
Lastpage :
1
Abstract :
Summary form only given, as follows. The 2011 Roger A. Haken Best Student Paper Award is awarded to: Tomoyuki Yokota of The University of Tokyo, for the paper entitled: "Sheet-type Organic Active Matrix Amplifier System Using Vth-Tunable, Pseudo-CMOS Circuits with Floating-gate Structure." The EDS Paul Rappaport Award is awarded to: Tibor Grasser, Ben Kaczer, Wolfgang Goes, Hans Reisinger, Thomas Aichinger, Philipp Hehenberger, Paul-Jurgen Wagner, Franz Schanovsky, Jacopo Franco, Maria Toledano Luque, Michael Nelheibel of the Technical University of Vienna, for the paper entitled: "The Paradigm Shift in Understanding the Bias Temperature Instability: From Reaction-Diffusion to Switching Oxide Traps." The EDS George E. Smith Award is awarded to: Jin Jang, Mallory Mativenga, Min Hyuk Choi, Jae Won Choi of Kyung Hee University, for the paper entitled: "Transparent Flexible Circuits Based on Amorphous-Indium-Gallium-Zinc-Oside Thin-Film Transistors." The 2012 EDS Distinguished Service Award is awarded to: Douglas P. Verret of Texas Instruments, Inc. "To recognize and honor outstanding service to the Electron Devices Society." The 2012 EDS Education Award is awarded to: Jesus A. del Alamo of the Massachusetts Institute of Technology "For pioneering contributions to the development of online laboratories for microelectronics education on a worldwide scale." The 2012 EDS J.J. Ebers Award is awarded to: Yuan Taur of the University of California "For contributions to the advancement of several generations of CMOS process technologies." EDS Celebrated Member is awarded to: Leo Esaki, Tsukuba "For fundamental contributions to the field of electron devices for the benefit of humanity."
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting (IEDM), 2012 IEEE International
Conference_Location :
San Francisco, CA, USA
ISSN :
0163-1918
Print_ISBN :
978-1-4673-4872-0
Electronic_ISBN :
0163-1918
Type :
conf
DOI :
10.1109/IEDM.2012.6478953
Filename :
6478953
Link To Document :
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