• DocumentCode
    3543308
  • Title

    A discrete ferroelectric memory

  • Author

    Evans, Joseph ; Montross, Naomi ; Salazar, Gerald ; Howard, Bob ; Smith, Samuel ; Chapman, Sean ; Gallegos, Anthony

  • Author_Institution
    Radiant Technol., Inc., Albuquerque, NM, USA
  • fYear
    2012
  • fDate
    Oct. 31 2012-Nov. 2 2012
  • Firstpage
    33
  • Lastpage
    36
  • Abstract
    Ferroelectric-based nonvolatile memory (FeRAM) is now a mainstream product category supported by Ramtron, Fujitsu, Texas Instruments, IBM, and Matsushita. The internal array of ferroelectric capacitors in FeRAMs consumes absolutely no energy when the chip is powered. This lack of energy consumption combined with SRAM-like operation at SRAM speeds constitutes a unique advantage for FeRAM memory in low-power embedded applications. Because the ferroelectric technology is buried deep inside the IC package surrounded by digital interface circuits, the true nature of ferroelectric memory capacitor operation is obscured from the user. It is possible to operate a simple ferroelectric nonvolatile memory from the I/O pins of a microprocessor using discrete ferroelectric capacitors in a Sawyer-Tower circuit configuration. Designing and operating a ferroelectric memory with discrete capacitors provides insight into the nature of FeRAMs, their internal operation, and their reliability. The read and write times of the discrete memory will be fast, limited only by the current capacity of the I/O pins. The discrete ferroelectric capacitors will retain their written state without concern for whether the microcontroller is powered or not. Unlike EEPROM or FLASH transistors, discrete ferroelectric capacitors can be physically handled during retention without corrupting their stored states.
  • Keywords
    SRAM chips; embedded systems; ferroelectric capacitors; ferroelectric storage; integrated circuit packaging; low-power electronics; microprocessor chips; reliability; EEPROM; FLASH transistors; FeRAM; SRAM; Sawyer-Tower circuit configuration; digital interface circuits; discrete ferroelectric memory; ferroelectric based nonvolatile memory; ferroelectric memory capacitor; integrated circuit package; low-power embedded applications; microprocessor; reliability; stored states; Capacitors; Fatigue; Ferroelectric films; Microprocessors; Nonvolatile memory; Pins; Random access memory; ferroelectric capacitor memory microprocessor;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Non-Volatile Memory Technology Symposium (NVMTS), 2012 12th Annual
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4673-2847-0
  • Type

    conf

  • DOI
    10.1109/NVMTS.2013.6632857
  • Filename
    6632857