Title :
A discrete ferroelectric memory
Author :
Evans, Joseph ; Montross, Naomi ; Salazar, Gerald ; Howard, Bob ; Smith, Samuel ; Chapman, Sean ; Gallegos, Anthony
Author_Institution :
Radiant Technol., Inc., Albuquerque, NM, USA
fDate :
Oct. 31 2012-Nov. 2 2012
Abstract :
Ferroelectric-based nonvolatile memory (FeRAM) is now a mainstream product category supported by Ramtron, Fujitsu, Texas Instruments, IBM, and Matsushita. The internal array of ferroelectric capacitors in FeRAMs consumes absolutely no energy when the chip is powered. This lack of energy consumption combined with SRAM-like operation at SRAM speeds constitutes a unique advantage for FeRAM memory in low-power embedded applications. Because the ferroelectric technology is buried deep inside the IC package surrounded by digital interface circuits, the true nature of ferroelectric memory capacitor operation is obscured from the user. It is possible to operate a simple ferroelectric nonvolatile memory from the I/O pins of a microprocessor using discrete ferroelectric capacitors in a Sawyer-Tower circuit configuration. Designing and operating a ferroelectric memory with discrete capacitors provides insight into the nature of FeRAMs, their internal operation, and their reliability. The read and write times of the discrete memory will be fast, limited only by the current capacity of the I/O pins. The discrete ferroelectric capacitors will retain their written state without concern for whether the microcontroller is powered or not. Unlike EEPROM or FLASH transistors, discrete ferroelectric capacitors can be physically handled during retention without corrupting their stored states.
Keywords :
SRAM chips; embedded systems; ferroelectric capacitors; ferroelectric storage; integrated circuit packaging; low-power electronics; microprocessor chips; reliability; EEPROM; FLASH transistors; FeRAM; SRAM; Sawyer-Tower circuit configuration; digital interface circuits; discrete ferroelectric memory; ferroelectric based nonvolatile memory; ferroelectric memory capacitor; integrated circuit package; low-power embedded applications; microprocessor; reliability; stored states; Capacitors; Fatigue; Ferroelectric films; Microprocessors; Nonvolatile memory; Pins; Random access memory; ferroelectric capacitor memory microprocessor;
Conference_Titel :
Non-Volatile Memory Technology Symposium (NVMTS), 2012 12th Annual
Conference_Location :
Singapore
Print_ISBN :
978-1-4673-2847-0
DOI :
10.1109/NVMTS.2013.6632857