Title :
Highly-scalable threshold switching select device based on chaclogenide glasses for 3D nanoscaled memory arrays
Author :
Myoung-Jae Lee ; Dongsoo Lee ; Hojung Kim ; Hyun-Sik Choi ; Jong-Bong Park ; Hee Goo Kim ; Young-Kwan Cha ; U-In Chung ; In-Kyeong Yoo ; Kinam Kim
Author_Institution :
Semicond. Device Lab., Samsung Adv. Inst. of Technol., Yongin, South Korea
Abstract :
We present here on a switch device made of a nitridized-chalcogenide glass for application in nanoscale array circuits. Previously, AsTeGeSi-based switches have had key issues with performance degradation over time. This is usually due to changes in the Te concentration in the device active region [1-3]. However, our AsTeGeSiN switches were able to overcome this limitation as well as scale down to 30 nm with an on current of 100 μA (J > 1.1×107A/cm2). Their cycling performance was shown to be greater than 108. Also, we demonstrate a memory cell using a TaOx resistance memory with the AsTeGeSiN select device.
Keywords :
arsenic compounds; chalcogenide glasses; germanium compounds; nanoelectronics; silicon compounds; storage management chips; switches; tantalum compounds; tellurium compounds; three-dimensional integrated circuits; transmission electron microscopy; 3D nanoscaled memory arrays; AsTeGeSiN; TaOx; highly-scalable threshold switching select device; memory cell; nanoscale array circuits; nitridized-chalcogenide glass; resistance memory; size 100 mum; Annealing; Films; Optical switches; Plasmas; Tin; Voltage measurement;
Conference_Titel :
Electron Devices Meeting (IEDM), 2012 IEEE International
Conference_Location :
San Francisco, CA
Print_ISBN :
978-1-4673-4872-0
Electronic_ISBN :
0163-1918
DOI :
10.1109/IEDM.2012.6478966