DocumentCode :
35434
Title :
8-bit 5-MS/s Analog-to-Digital Converter for Pixel-Level Integration
Author :
Hansen, Karsten ; Reckleben, Christian ; Kalavakuru, Pradeep ; Szymanski, Janusz ; Diehl, Inge
Author_Institution :
Deutsches Elektronen-Synchrotron (DESY), Hamburg, Germany
Volume :
60
Issue :
5
fYear :
2013
fDate :
Oct. 2013
Firstpage :
3843
Lastpage :
3851
Abstract :
A pixel-level 8-bit 5-MS/s Wilkinson-type analog-to-digital converter was designed and fabricated in the IBM 8M1P 130-nm CMOS technology. The pixel blocks are implemented with a core area of 130 μm by 140 μm, consuming about 560 μW at 1.2 V. Taking the measured dynamic range of 0.86 V into account, a signal-to-noise ratio above 65 dB was achieved for small signal amplitudes. The maximum differential and integral nonlinearity remains well below 0.4 LSB and 0.5 LSB, respectively. The conversion time is 160 ns, and the energy per conversion step 470 fJ. The digitizer permits the trimming of gain and offset.
Keywords :
CMOS integrated circuits; analogue-digital conversion; CMOS technology; Wilkinson-type analog-to-digital converter; pixel-level integration; signal-to-noise ratio; Application specific integrated circuits; Clocks; Decision support systems; Noise; Transmission line measurements; Voltage measurement; X-ray imaging; Analog-to-digital converter (ADC); DEPFET sensor with signal compression (DSSC); X-ray free electron laser (XFEL); X-ray imager; pixel level;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.2013.2280660
Filename :
6616681
Link To Document :
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