• DocumentCode
    35434
  • Title

    8-bit 5-MS/s Analog-to-Digital Converter for Pixel-Level Integration

  • Author

    Hansen, Karsten ; Reckleben, Christian ; Kalavakuru, Pradeep ; Szymanski, Janusz ; Diehl, Inge

  • Author_Institution
    Deutsches Elektronen-Synchrotron (DESY), Hamburg, Germany
  • Volume
    60
  • Issue
    5
  • fYear
    2013
  • fDate
    Oct. 2013
  • Firstpage
    3843
  • Lastpage
    3851
  • Abstract
    A pixel-level 8-bit 5-MS/s Wilkinson-type analog-to-digital converter was designed and fabricated in the IBM 8M1P 130-nm CMOS technology. The pixel blocks are implemented with a core area of 130 μm by 140 μm, consuming about 560 μW at 1.2 V. Taking the measured dynamic range of 0.86 V into account, a signal-to-noise ratio above 65 dB was achieved for small signal amplitudes. The maximum differential and integral nonlinearity remains well below 0.4 LSB and 0.5 LSB, respectively. The conversion time is 160 ns, and the energy per conversion step 470 fJ. The digitizer permits the trimming of gain and offset.
  • Keywords
    CMOS integrated circuits; analogue-digital conversion; CMOS technology; Wilkinson-type analog-to-digital converter; pixel-level integration; signal-to-noise ratio; Application specific integrated circuits; Clocks; Decision support systems; Noise; Transmission line measurements; Voltage measurement; X-ray imaging; Analog-to-digital converter (ADC); DEPFET sensor with signal compression (DSSC); X-ray free electron laser (XFEL); X-ray imager; pixel level;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2013.2280660
  • Filename
    6616681