DocumentCode
35434
Title
8-bit 5-MS/s Analog-to-Digital Converter for Pixel-Level Integration
Author
Hansen, Karsten ; Reckleben, Christian ; Kalavakuru, Pradeep ; Szymanski, Janusz ; Diehl, Inge
Author_Institution
Deutsches Elektronen-Synchrotron (DESY), Hamburg, Germany
Volume
60
Issue
5
fYear
2013
fDate
Oct. 2013
Firstpage
3843
Lastpage
3851
Abstract
A pixel-level 8-bit 5-MS/s Wilkinson-type analog-to-digital converter was designed and fabricated in the IBM 8M1P 130-nm CMOS technology. The pixel blocks are implemented with a core area of 130 μm by 140 μm, consuming about 560 μW at 1.2 V. Taking the measured dynamic range of 0.86 V into account, a signal-to-noise ratio above 65 dB was achieved for small signal amplitudes. The maximum differential and integral nonlinearity remains well below 0.4 LSB and 0.5 LSB, respectively. The conversion time is 160 ns, and the energy per conversion step 470 fJ. The digitizer permits the trimming of gain and offset.
Keywords
CMOS integrated circuits; analogue-digital conversion; CMOS technology; Wilkinson-type analog-to-digital converter; pixel-level integration; signal-to-noise ratio; Application specific integrated circuits; Clocks; Decision support systems; Noise; Transmission line measurements; Voltage measurement; X-ray imaging; Analog-to-digital converter (ADC); DEPFET sensor with signal compression (DSSC); X-ray free electron laser (XFEL); X-ray imager; pixel level;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.2013.2280660
Filename
6616681
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