DocumentCode :
3543447
Title :
Advanced flexible CMOS integrated circuits on plastic enabled by controlled spalling technology
Author :
Shahrjerdi, Davood ; Bedell, Stephen W. ; Khakifirooz, A. ; Fogel, K. ; Lauro, Paul ; Cheng, K. ; Ott, John A. ; Gaynes, Michael ; Sadana, Devendra K.
Author_Institution :
T.J. Watson Res. Center, IBM Res., Yorktown Heights, NY, USA
fYear :
2012
fDate :
10-13 Dec. 2012
Abstract :
We present, for the first time, mechanically-flexible advanced-node CMOS circuits, including SRAM and ring oscillators, with gate lengths <;30 nm and contacted gate pitch of 100 nm. Our novel layer transfer technique called “controlled spalling” is employed as an incredibly simple, low-cost, and manufacturable approach to separate the finished CMOS circuits from the host silicon substrate. The overall performance of the flexible devices and circuits are carefully examined, demonstrating functional SRAM cells down to VDD=0.6V and ring oscillators with record stage delay of ~16ps, the best reported to date for a flexible circuit.
Keywords :
CMOS memory circuits; SRAM chips; flexible electronics; oscillators; plastics; controlled spalling technology; flexible circuit; flexible devices; functional SRAM cells; host silicon substrate; layer transfer technique; mechanically-flexible advanced-node CMOS circuits; plastic; ring oscillators; CMOS integrated circuits; Degradation; Delay; Performance evaluation; Ring oscillators; Silicon; Strain;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting (IEDM), 2012 IEEE International
Conference_Location :
San Francisco, CA
ISSN :
0163-1918
Print_ISBN :
978-1-4673-4872-0
Electronic_ISBN :
0163-1918
Type :
conf
DOI :
10.1109/IEDM.2012.6478981
Filename :
6478981
Link To Document :
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